Overview
This workshop discusses at-speed faults and how to use TetraMAX for at-speed test. Topics include description, recommendation, and scripts of transition, small-delay defect, and path-delay fault model ATPG. Also covered are the Onchip Clock Controller (OCC) flow, which leverages the PLL fast clocks, and using PrimeTime to generate the necessary data for at-speed test. Hands-on labs follow each training module, allowing you to apply the skills learned in lecture. Labs include: using PrimeTime to generate the necessary files for at-speed ATPG; generating the patterns for different fault models in Tetramax; and, finally, using VCS for simulating the patterns generated.
Objectives At the end of this workshop the student should be able to:
- Describe the need for At-Speed testing
- List the At-Speed fault models available
- Describe the two launch techniques for at-speed faults
- Successfully edit a stuck-at SPF file to suit at-speed fault model
- Define the timing exceptions
- Automate the process of script generation for TetraMAX, using PrimeTime. This script will take care of the false and multi-cycle paths
- Modify a given stuck-at fault model script to run for an at-speed fault model
- State the steps required to merge transition and stuck-at fault patterns to reduce the overall patterns
- Automatically create scripts that can be used in PrimeTime to perform test mode STA
- Describe the SDD flow
- Describe the flow needed to successfully use the PLL present in your design to give the at-speed clock during capture mode
- State the steps needed to perform path-delay ATPG
- Understand the fault classification in path-delay ATPG
Audience Profile
Engineers who use ATPG tools to generate patterns for different fault models.
Prerequisites
To benefit the most from the material presented in this workshop, you should: A. Have taken the TetraMAX 1 workshop. OR B. Possess knowledge in the following areas:
- Scan Architecture and ATPG
- Stuck-At fault model ATPG with TetraMAX
- SPF file
Course Outline Module 1
- Introduction of At-Speed defects
- Source of Test Escapes and chip failure
- Requirements for At-Speed testing
- Popular fault models for At-Speed testing
Module 2
- Transition Fault model
- Path Delay Fault model
- At-Speed Fault Detection Method
- Techniques to Launch and Capture a Fault
Module 3
- STIL file
- Modifications to STIL file for At-Speed testing
- Generic Capture Procedures
Module 4
- Timing Exceptions
- Automated Way to Generate Timing Exceptions form PrimeTime
Module 5
- TetraMAX Scripts for Transition ATPG
- Design Guidelines
- Flow Considerations and Requirements
- Pattern Merging
- Automated way to generate the scripts for PrimeTime to perform testmode STA
Module 6
- What is a Small Delay Defect ATPG
- How to use PrimeTime to Generate the Slack Data
- ATPG Flow in TetraMAX
Module 7
- Requirement of PLL for At-speed faults
- The various clocks in PLL flow
- Use QuickSTIL to generate the SPF
Module 8
- TetraMAX scripts for Path Delay ATPG
- Fault Classification for Path Delay Faults
- Generating Paths for TetraMAX Using PrimeTime
- Reconvergence Paths
- Hazard Simulation
Module 9
- Conclusion
- Topics Covered
- Fault model and Features of TetraMAX
- Solvnet Resources
總部李老師